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 XBright(R) Power Chip LED
CXXXXB900-SX000-A
Cree's XBTM power chip series of LEDs are the next generation of solid-state LED emitters that combine highly efficient InGaN materials with Cree's proprietary G*SiC(R) substrate to deliver superior price/performance for high-intensity LEDs. These LED chips have a geometrically enhanced Epi-down design to maximize light extraction efficiency and require only a single wire bond connection. These LEDs are useful in a broad range of applications such as outdoor full-motion LED video signs, automotive lighting and white LEDs. Cree's XB power chips are compatible with optical power packages that employ proper thermal management.
FEATURES
* * * XBright LED Technology Larger "Power Chip" Design High Performance - - - * * 90 mW min. (460 & 470 nm) Blue 60 mW min. (505 nm) Traffic Green 40 mW min. (527 nm) Green
APPLICATIONS
* General Illumination - - - - - * * * Automobile Aircraft Decorative Lighting Task Lighting Outdoor Illumination
Single Wire Bond Structure AuSn Backside Metalization
White LEDs Backlighting Traffic Signals
CXXXXB900-SX000-A Chip Diagram
Top View G*SiC LED Chip 900 x 900 m
Bottom View
Die Cross Section
R3CM, Rev. D Datasheet: CP
764 m Contact Metal Width = 30 m Bond Pad 120 m Diameter SiC Substrate h = 250 m Cathode (-)
InGaN
Anode (+)
Subject to change without notice. www.cree.com
Maximum Ratings at TA = 5C Note DC Forward Current Peak Forward Current (1/10 duty cycle @ 1kHz) LED Junction Temperature Reverse Voltage Operating Temperature Range Storage Temperature Range Typical Electrical/Optical Characteristics at TA = 5C, If = 350mA Part Number Forward Voltage (Vf, V) Min. C460XB900-S9000-A C470XB900-S9000-A C505XB900-S6000-A C527XB900-S4000-A Mechanical Specifications Description P-N Junction Area (m) Top Area (m) Bottom Area (m) Chip Thickness (m) Top Au Bond Pad Diameter (m) Au Bond Pad Thickness (m) Back Contact Metal Area (m) Back Contact Metal Thickness (m) 3.0 3.0 3.0 3.0 Typ. 3.4 3.4 3.4 3.4 Max. 3.9 3.9 3.9 3.9
Note
CXXXXB900-SX000-A 500 mA
Note 2
700 mA 125C 5V -40C to +85C -40C to +100C
Reverse Current [I(Vr=5V), A] Max. 10 10 10 10
Full Width Half Max (D, nm) Typ. 21 22 30 35 CXXXXB900-SX000-A Dimension 848 x 848 725 x 725 900 x 900 250 120 1.2 764 x 764 1.7 Tolerance 25 25 50 25 10 0.5 25 0.3
Notes:
1. 2.
3. 4. 5. 6.
Maximum ratings are package dependent. The above ratings were determined using a Au-plated TO39 header without an encapsulant for characterization. Ratings for other packages may differ. The junction temperature should be characterized in a specific package to determine limitations. Assembly processing temperature must not exceed 325C (< 5 seconds). All products conform to the listed minimum and maximum specifications for electrical and optical characteristics when assembled and operated at 350 mA within the maximum ratings shown above. Efficiency decreases at higher currents. Typical values given are within the range of average expected by manufacturer in large quantities and are provided for information only. All measurements were made using a Au-plated TO39 header without an encapsulant. Optical characteristics measured in an integrating sphere using Illuminance E. Back contact metal is 80%/20% Au/Sn by weight, with target eutectic melting temperature of approximately 282C. Caution: To avoid leakage currents and achieve maximum output efficiency, die attach material must not contact the side of the chip. XB900 chips are shipped with the junction side up, requiring die transfer prior to die attach. Specifications are subject to change without notice.
Copyright (c) 2005-2006 Cree, Inc. All rights reserved. The information in this document is subject to change without notice. Cree, the Cree logo, G*SiC and XBright are registered trademarks, and XB is a trademark of Cree, Inc.
Cree, Inc. 4600 Silicon Drive Durham, NC 27703 USA Tel: +1.919.313.5300 www.cree.com
CPR3CM Rev. D
Standard Bins for CXXXXB900-SX000-A
LED chips are sorted to the radiant flux and dominant wavelength bins shown. A sorted die sheet contains die from only one bin. Sorted die kit (CXXXXB900-SX000-A) orders may be filled with any or all bins (CxxxXB290-02xx-A) contained in the kit. All radiant flux and all dominant wavelength values shown and specified are at If = 350 mA. Radiant flux values are measured using Au-plated TO39 headers without an encapsulant. C460XB900-S9000-A Radiant Flux
C460XB900-0213-A C460XB900-0214-A C460XB900-0210-A C460XB900-0206-A C460XB900-0202-A C460XB900-0215-A C460XB900-0211-A C460XB900-0207-A C460XB900-0203-A C460XB900-0216-A C460XB900-0212-A C460XB900-0208-A C460XB900-0204-A
165 mW 140 mW 115 mW
C460XB900-0209-A C460XB900-0205-A C460XB900-0201-A
90 mW 455 nm
457.5 nm
460 nm Dominant Wavelength C470XB900-S9000-A
462.5 nm
465 nm
Radiant Flux
140 mW 115 mW
C470XB900-0209-A C470XB900-0205-A C470XB900-0201-A
C470XB900-0210-A C470XB900-0206-A C470XB900-0202-A
C470XB900-0211-A C470XB900-0207-A C470XB900-0203-A
C470XB900-0212-A C470XB900-0208-A C470XB900-0204-A
90 mW 465 nm
467.5 nm
470 nm Dominant Wavelength C505XB900-S6000-A
472.5 nm
475 nm
Radiant Flux
85 mW
C505XB900-0203-A C505XB900-0201-A
C505XB900-0204-A C505XB900-0202-A
60 mW 500 nm
505 nm Dominant Wavelength C57XB900-S4000-A
510 nm
Radiant Flux
75 mW 55 mW
C527XB900-0207-A C527XB900-0204-A C527XB900-0201-A
C527XB900-0208-A C527XB900-0205-A C527XB900-0202-A
C527XB900-0209-A C527XB900-0206-A C527XB900-0203-A
40 mW 520 nm
525 nm 530 nm Dominant Wavelength
535 nm
Copyright (c) 2005-2006 Cree, Inc. All rights reserved. The information in this document is subject to change without notice. Cree, the Cree logo, G*SiC and XBright are registered trademarks, and XB is a trademark of Cree, Inc.
Cree, Inc. 4600 Silicon Drive Durham, NC 27703 USA Tel: +1.919.313.5300 www.cree.com
3
CPR3CM Rev. D
Characteristic Curves, TA = 25C
Typical Junction Temp. Curves, If = 350 mA
Forward Current vs Forward Voltage
400
Relative Light Intensity
100% 90% 80% 70% 60% 50% 40% 30% 470nm 20%
350
300
250
200
150
100
50 10% 0 0 0.5 1 1.5 2 Vf (V) 2.5 3 3.5 4 0% 0 25 50 75 Junction Temperature (C) 100 125
Relative Light Intensity
If (mA)
Relative Intensity vs Forward Current
140
Wavelength Shift
6.0
5.0 120 Wavelength Shift (nm)
100
4.0
80 % 60
3.0
2.0 470nm
40
20
1.0
0 0 50 100 150 200 If (mA) 250 300 350 400
0.0 0 25 50 75 Junction Temperature (C) 100 125
Dominant Wavelength Shift vs Forward Current
0.0 10
Voltage Shift
8 -0.1
6 Shift (nm)
Voltage Shift (V) 470nm 527nm
4
-0.2
2 -0.3 0 470nm -0.4 0 50 100 150 200 If (mA) 250 300 350 400 0 25 50 75 100 125
-2
Junction Temperature (C)
Copyright (c) 2005-2006 Cree, Inc. All rights reserved. The information in this document is subject to change without notice. Cree, the Cree logo, G*SiC and XBright are registered trademarks, and XB is a trademark of Cree, Inc.
Cree, Inc. 4600 Silicon Drive Durham, NC 27703 USA Tel: +1.919.313.5300 www.cree.com
4
CPR3CM Rev. D


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